Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speed

A theoretical study of single and multimode vertical-cavity surface-emitting lasers (VCSELs) subject to pseudorandom modulation of the current at a rate of 10 Gb/s is performed. Eye diagrams, probability density functions of the power at the decision time, averaged turn-on delay, and timing jitter a...

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Detalhes bibliográficos
Autores: Valle, Ángel, Pesquera, Luis
Tipo de documento: artigo
Estado:Versión aceptada para publicación
Data de publicação:2006
País:España
Recursos:Consejo Superior de Investigaciones Científicas (CSIC)
Repositório:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/384646
Acesso em linha:http://hdl.handle.net/10261/384646
Access Level:Acceso aberto
Palavra-chave:Semiconductor lasers
Current modulation
Vertical cavity lasers
Transverse modes
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spelling Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speedValle, ÁngelPesquera, LuisSemiconductor lasersCurrent modulationVertical cavity lasersTransverse modesA theoretical study of single and multimode vertical-cavity surface-emitting lasers (VCSELs) subject to pseudorandom modulation of the current at a rate of 10 Gb/s is performed. Eye diagrams, probability density functions of the power at the decision time, averaged turn-on delay, and timing jitter are analyzed for different values of the on- and off-state currents. Bit sequences where errors occur are identified. Extensive simulations have been performed to obtain the bit-error rate (BER) for the back-to-back configuration. We find that the BER performance of single-mode VCSELs is better than the one obtained with multimode VCSELs when the off-state current is smaller than the threshold current. The same result is obtained when the off-state current is larger than the threshold value, providing that the on-state current is large enough. However, BER in single-mode VCSELs is greater than in multimode VCSELs when the off-state current is equal to the threshold current. BER performance is also better for multimode VCSELs when the off-state current is larger than the threshold value, if the on-state current is small enough.Financial support has been provided by CICYT (Spain) Project TIC2002-04255-C04-01 and by EC Human Potential Research Training Network VISTA (HPRN CT-2000-00034).Peer reviewedInstitute of Electrical and Electronics EngineersComisión Interministerial de Ciencia y Tecnología, CICYT (España)European CommissionConsejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202520252006info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Postprintinfo:eu-repo/semantics/acceptedVersionhttp://hdl.handle.net/10261/384646reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Ingléshttps://doi.org/10.1109/JQE.2006.871553Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/3846462026-05-22T06:33:51Z
dc.title.none.fl_str_mv Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speed
title Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speed
spellingShingle Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speed
Valle, Ángel
Semiconductor lasers
Current modulation
Vertical cavity lasers
Transverse modes
title_short Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speed
title_full Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speed
title_fullStr Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speed
title_full_unstemmed Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speed
title_sort Analysis of bit-error rate of vertical-cavity surface-emitting lasers modulated at high speed
dc.creator.none.fl_str_mv Valle, Ángel
Pesquera, Luis
author Valle, Ángel
author_facet Valle, Ángel
Pesquera, Luis
author_role author
author2 Pesquera, Luis
author2_role author
dc.contributor.none.fl_str_mv Comisión Interministerial de Ciencia y Tecnología, CICYT (España)
European Commission
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Semiconductor lasers
Current modulation
Vertical cavity lasers
Transverse modes
topic Semiconductor lasers
Current modulation
Vertical cavity lasers
Transverse modes
description A theoretical study of single and multimode vertical-cavity surface-emitting lasers (VCSELs) subject to pseudorandom modulation of the current at a rate of 10 Gb/s is performed. Eye diagrams, probability density functions of the power at the decision time, averaged turn-on delay, and timing jitter are analyzed for different values of the on- and off-state currents. Bit sequences where errors occur are identified. Extensive simulations have been performed to obtain the bit-error rate (BER) for the back-to-back configuration. We find that the BER performance of single-mode VCSELs is better than the one obtained with multimode VCSELs when the off-state current is smaller than the threshold current. The same result is obtained when the off-state current is larger than the threshold value, providing that the on-state current is large enough. However, BER in single-mode VCSELs is greater than in multimode VCSELs when the off-state current is equal to the threshold current. BER performance is also better for multimode VCSELs when the off-state current is larger than the threshold value, if the on-state current is small enough.
publishDate 2006
dc.date.none.fl_str_mv 2006
2025
2025
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Postprint
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/384646
url http://hdl.handle.net/10261/384646
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv https://doi.org/10.1109/JQE.2006.871553
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers
publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,228081

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