Mode partition noise in multi-transverse mode vertical-cavity surface-emitting lasers
Relative intensity noise spectra of weakly index guided VCSELs in a multi—transverse mode regime are analyzed by using a model that takes into account all the transverse modes supported by the waveguide. Several resonance peaks are obtained in the noise spectra that correspond to the relaxation osci...
| Autores: | , |
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| Tipo de documento: | artigo |
| Estado: | Versão publicada |
| Data de publicação: | 1999 |
| País: | España |
| Recursos: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositório: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/393614 |
| Acesso em linha: | http://hdl.handle.net/10261/393614 |
| Access Level: | Acceso aberto |
| Palavra-chave: | Semiconductor lasers Relative intensity noise Vertical cavity lasers Transverse modes |
| Resumo: | Relative intensity noise spectra of weakly index guided VCSELs in a multi—transverse mode regime are analyzed by using a model that takes into account all the transverse modes supported by the waveguide. Several resonance peaks are obtained in the noise spectra that correspond to the relaxation oscillation frequencies of the transverse modes. In is shown that for low spatially overlapping transverse modes, low RIN operation can be maintained. However, the excitation of transverse modes with a significant mode overlap leads to a clear enhancement of the RIN at low frequencies. |
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