Electron beam induced current and scanning tunnelling spectroscopy correlative study of Cd-xHg_(1-x)Te and CdTe crystals
A combined scanning electron microscope-scanning tunnelling microscope (SEM-STM) system has been used to characterize CdxHg1-xTe and CdTe crystals, The electron beam induced current (EBIC) mode of the SEM shows the existence of inhomogeneities in the electronic behaviour of the samples, mainly relat...
| Autores: | , , |
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| Tipo de documento: | artigo |
| Data de publicação: | 1998 |
| País: | España |
| Recursos: | Universidad Complutense de Madrid (UCM) |
| Repositório: | Docta Complutense |
| Idioma: | inglês |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/59141 |
| Acesso em linha: | https://hdl.handle.net/20.500.14352/59141 |
| Access Level: | Acceso aberto |
| Palavra-chave: | 538.9 Imaging Tunneling Spectroscopy Si(111)2x1 Surface Microscopy Cathodoluminescence Cdte(001) Defects Física de materiales |
| Resumo: | A combined scanning electron microscope-scanning tunnelling microscope (SEM-STM) system has been used to characterize CdxHg1-xTe and CdTe crystals, The electron beam induced current (EBIC) mode of the SEM shows the existence of inhomogeneities in the electronic behaviour of the samples, mainly related to the presence of subgrain boundaries and precipitates. Current imaging tunnelling spectroscopy images and the related normalized differential conductance curves, obtained with the STM, reveal the electronic inhomogeneities at a finer scale. In particular, local variations of the band gap were shown by the conductance curves in regions with strong EBIC contrast. SEM-and STM-based techniques in a combined instrument appear to be complementary characterization techniques. |
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