Modeling the Effect of SEUs on the Configuration Memory of SRAM-FPGA based CNN Accelerators
| Authors: | , , , , , , |
|---|---|
| Format: | article |
| Publication Date: | 2024 |
| Country: | España |
| Institution: | Universidad Politécnica de Madrid |
| Repository: | Archivo Digital UPM |
| OAI Identifier: | oai:oa.upm.es:83632 |
| Online Access: | https://oa.upm.es/83632/ |
| Access Level: | Open access |
| Keyword: | Field programmable gate arrays Circuit faults Reliability Hardware Software Reliability engineering Fault tolerant systems Convolutional Neural Networks Soft Errors FPGA Accelerator Fault Injection Modeling Simulator |
| Description not available. |