Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface

Van der Waals layered ferroelectrics, such as CuInP2S6 (CIPS), offer a versatile platform for miniaturization of ferroelectric device technology. Control of the targeted composition and kinetics of CIPS synthesis, enables the formation of stable self-assembled heterostructures of ferroelectric CIPS...

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Autores: Checa Nualart, Martí, Jin, Xin, Millán Solsona, Rubén, Neumayer, Sabine M., Susner, Michael A., McGuire, Michael A., O'Hara, Andrew, Gomila Lluch, Gabriel, Maksymovych, Petro, Pantelides, Socrates T., Collins, Liam
Formato: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2022
País:España
Recursos:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
Repositorio:Recercat. Dipósit de la Recerca de Catalunya
OAI Identifier:oai:recercat.cat:2445/197427
Acesso em linha:https://hdl.handle.net/2445/197427
Access Level:acceso abierto
Palavra-chave:Microscòpia electrònica d'escombratge
Nanotecnologia
Microscòpia de força atòmica
Scanning electron microscopy
Nanotechnology
Atomic force microscopy
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spelling Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 HeterointerfaceCheca Nualart, MartíJin, XinMillán Solsona, RubénNeumayer, Sabine M.Susner, Michael A.McGuire, Michael A.O'Hara, AndrewGomila Lluch, GabrielMaksymovych, PetroPantelides, Socrates T.Collins, LiamMicroscòpia electrònica d'escombratgeNanotecnologiaMicroscòpia de força atòmicaScanning electron microscopyNanotechnologyAtomic force microscopyVan der Waals layered ferroelectrics, such as CuInP2S6 (CIPS), offer a versatile platform for miniaturization of ferroelectric device technology. Control of the targeted composition and kinetics of CIPS synthesis, enables the formation of stable self-assembled heterostructures of ferroelectric CIPS and non-ferroelectric In4/3P2S6 (IPS). Here, we use advanced quantitative scanning probe microscopy and density-functional-theory to explore in detail the nanoscale variability in dynamic functional properties of the CIPS-IPS heterostructure. We report evidence of fast ionic transport mediating an appreciable out-of-plane electromechanical response of CIPS in the paraelectric phase. Further, we map the local dielectric constant and ionic conductivity on the nanoscale as we thermally stimulate the ferroelectric-paraelectric phase transition, recovering the bulk dielectric peak of the transition at the nanoscale. Finally, we discover a conductivity enhancement at the CIPS/IPS interface, indicating the possibility of engineering its interfacial properties for next generation device applications.American Chemical Society2023202320222023info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersion29 p.application/pdfapplication/pdfhttps://hdl.handle.net/2445/197427Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)reponame:Recercat. Dipósit de la Recerca de Catalunyainstname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)InglésVersió postprint del document publicat a: https://doi.org/10.1021/acsnano.2c06992ACS Nano, 2022, vol. 16, num. 9, p. 15347-15357https://doi.org/10.1021/acsnano.2c06992(c) American Chemical Society , 2022info:eu-repo/semantics/openAccessoai:recercat.cat:2445/1974272026-05-29T05:05:01Z
dc.title.none.fl_str_mv Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface
title Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface
spellingShingle Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface
Checa Nualart, Martí
Microscòpia electrònica d'escombratge
Nanotecnologia
Microscòpia de força atòmica
Scanning electron microscopy
Nanotechnology
Atomic force microscopy
title_short Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface
title_full Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface
title_fullStr Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface
title_full_unstemmed Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface
title_sort Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP2S6-In4/3P2S6 Heterointerface
dc.creator.none.fl_str_mv Checa Nualart, Martí
Jin, Xin
Millán Solsona, Rubén
Neumayer, Sabine M.
Susner, Michael A.
McGuire, Michael A.
O'Hara, Andrew
Gomila Lluch, Gabriel
Maksymovych, Petro
Pantelides, Socrates T.
Collins, Liam
author Checa Nualart, Martí
author_facet Checa Nualart, Martí
Jin, Xin
Millán Solsona, Rubén
Neumayer, Sabine M.
Susner, Michael A.
McGuire, Michael A.
O'Hara, Andrew
Gomila Lluch, Gabriel
Maksymovych, Petro
Pantelides, Socrates T.
Collins, Liam
author_role author
author2 Jin, Xin
Millán Solsona, Rubén
Neumayer, Sabine M.
Susner, Michael A.
McGuire, Michael A.
O'Hara, Andrew
Gomila Lluch, Gabriel
Maksymovych, Petro
Pantelides, Socrates T.
Collins, Liam
author2_role author
author
author
author
author
author
author
author
author
author
dc.subject.none.fl_str_mv Microscòpia electrònica d'escombratge
Nanotecnologia
Microscòpia de força atòmica
Scanning electron microscopy
Nanotechnology
Atomic force microscopy
topic Microscòpia electrònica d'escombratge
Nanotecnologia
Microscòpia de força atòmica
Scanning electron microscopy
Nanotechnology
Atomic force microscopy
description Van der Waals layered ferroelectrics, such as CuInP2S6 (CIPS), offer a versatile platform for miniaturization of ferroelectric device technology. Control of the targeted composition and kinetics of CIPS synthesis, enables the formation of stable self-assembled heterostructures of ferroelectric CIPS and non-ferroelectric In4/3P2S6 (IPS). Here, we use advanced quantitative scanning probe microscopy and density-functional-theory to explore in detail the nanoscale variability in dynamic functional properties of the CIPS-IPS heterostructure. We report evidence of fast ionic transport mediating an appreciable out-of-plane electromechanical response of CIPS in the paraelectric phase. Further, we map the local dielectric constant and ionic conductivity on the nanoscale as we thermally stimulate the ferroelectric-paraelectric phase transition, recovering the bulk dielectric peak of the transition at the nanoscale. Finally, we discover a conductivity enhancement at the CIPS/IPS interface, indicating the possibility of engineering its interfacial properties for next generation device applications.
publishDate 2022
dc.date.none.fl_str_mv 2022
2023
2023
2023
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2445/197427
url https://hdl.handle.net/2445/197427
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Versió postprint del document publicat a: https://doi.org/10.1021/acsnano.2c06992
ACS Nano, 2022, vol. 16, num. 9, p. 15347-15357
https://doi.org/10.1021/acsnano.2c06992
dc.rights.none.fl_str_mv (c) American Chemical Society , 2022
info:eu-repo/semantics/openAccess
rights_invalid_str_mv (c) American Chemical Society , 2022
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 29 p.
application/pdf
application/pdf
dc.publisher.none.fl_str_mv American Chemical Society
publisher.none.fl_str_mv American Chemical Society
dc.source.none.fl_str_mv Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
reponame:Recercat. Dipósit de la Recerca de Catalunya
instname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
instname_str Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
reponame_str Recercat. Dipósit de la Recerca de Catalunya
collection Recercat. Dipósit de la Recerca de Catalunya
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,812455

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