Contrast and resolution of nanowires in electrostatic force microscopy
Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lis...
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| Formato: | artículo |
| Fecha de publicación: | 2009 |
| País: | España |
| Recursos: | Universidad Autónoma de Madrid |
| Repositorio: | Biblos-e Archivo. Repositorio Institucional de la UAM |
| Idioma: | inglés |
| OAI Identifier: | oai:repositorio.uam.es:10486/666305 |
| Acesso em linha: | http://hdl.handle.net/10486/666305 https://dx.doi.org/10.1109/TNANO.2008.2009356 |
| Access Level: | acceso abierto |
| Palavra-chave: | Atomic force microscopy (AFM) Electrostatic forces Nanowires Informática |
| Resumo: | Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. S. Gomez-Moñivas, "Contrast and Resolution of Nanowires in Electrostatic Force Microscopy", IEEE Transactions on nanotechonology, vol.8, no.2, pp. 148-152, Marzo 2009 |
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