Extraordinary transmission through arrays of slits: A circuit theory model
Extraordinary transmission and other interesting related phenomena for 1-D periodic arrays of slits (compound diffraction gratings) have recently been the object of intense research in the optics and solid state physics communities. This case should be differentiated from the extraordinary transmiss...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2010 |
| País: | Argentina |
| Institución: | Consejo Nacional de Investigaciones Científicas y Técnicas |
| Repositorio: | CONICET Digital (CONICET) |
| Idioma: | inglés |
| OAI Identifier: | oai:ri.conicet.gov.ar:11336/59032 |
| Acceso en línea: | http://hdl.handle.net/11336/59032 |
| Access Level: | acceso abierto |
| Palabra clave: | Diffraction Gratings Extraordinary Transmission Impedance Matching Surface Plasmon Polaritons (Spps) https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
| Sumario: | Extraordinary transmission and other interesting related phenomena for 1-D periodic arrays of slits (compound diffraction gratings) have recently been the object of intense research in the optics and solid state physics communities. This case should be differentiated from the extraordinary transmission through arrays of small apertures on metal screens since small holes only support below-cutoff modes, whereas slits can also support transverse electromagnetic modes without cutoff frequency. In this paper, an equivalent-circuit approach is proposed to account for the most relevant details of the behavior of slit-based periodic structures: extraordinary transmission peaks, FabryProt resonances, and transmission dips observed in compound structures. The proposed equivalent-circuit model, based on well-established concepts of waveguide and circuit theory, provides a simple and accurate description of the phenomenon that is appropriate for educational purposes, as well as for the design of potential devices based on the behavior of the structures under study. © 2006 IEEE. |
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