Ganapathy, S. (2014). Reliability in the face of variability in nanometer embedded memories.
Citación estilo ChicagoGanapathy, Shrikanth. Reliability in the Face of Variability in Nanometer Embedded Memories. 2014.
Cita MLAGanapathy, Shrikanth. Reliability in the Face of Variability in Nanometer Embedded Memories. 2014.
Precaución: Estas citas no son 100% exactas.