Cita APA

Tan, H., Lyu, J., Sheng, Y., Machado, P., Song, T., Bhatnagar, A., . . . Fina, I. (2022). A transversal approach to predict surface charge compensation in piezoelectric force microscopy.

Citación estilo Chicago

Tan, Huan, et al. A Transversal Approach to Predict Surface Charge Compensation in Piezoelectric Force Microscopy. 2022.

Cita MLA

Tan, Huan, et al. A Transversal Approach to Predict Surface Charge Compensation in Piezoelectric Force Microscopy. 2022.