Cita APA

Rafí, J. M., Simoen, E., Mercha, A., Hayama, K., Campabadal, F., Ohyama, H., & Claeys, C. (2007). Electrical stress on irradiated thin gate oxide partially depleted SOI nMOSFETs.

Citación estilo Chicago

Rafí, Joan Marc, E. Simoen, A. Mercha, K. Hayama, Francesca Campabadal, H. Ohyama, y C. Claeys. Electrical Stress On Irradiated Thin Gate Oxide Partially Depleted SOI NMOSFETs. 2007.

Cita MLA

Rafí, Joan Marc, et al. Electrical Stress On Irradiated Thin Gate Oxide Partially Depleted SOI NMOSFETs. 2007.