Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry

FONDECYT

Bibliographic Details
Authors: Martinez, A., Rayas, J. A., Cordero, R., Labbe, F.
Format: article
Status:Published version
Publication Date:2011
Country:Chile
Language:English
OAI Identifier:oai:repositorio.anid.cl:10533/143576
Online Access:https://hdl.handle.net/10533/143576
Access Level:Open access
Description
Summary:FONDECYT