Martinez, A., Rayas, J. A., Cordero, R., & Labbe, F. (2011). Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry.
Chicago Style CitationMartinez, A., J. A. Rayas, R. Cordero, and F. Labbe. Comparative Measurement of in Plane Strain By Shearography and Electronic Speckle Pattern Interferometry. 2011.
MLA CitationMartinez, A., J. A. Rayas, R. Cordero, and F. Labbe. Comparative Measurement of in Plane Strain By Shearography and Electronic Speckle Pattern Interferometry. 2011.
Warning: These citations may not always be 100% accurate.